p1 is the transient phenomenon generated when the analog power supply is disconnected from the inductive load. it is applicable to the situation that various duts are directly connected in parallel with the inductive load when they are used on the vehicle; p2a simulates the transient phenomenon caused by the sudden interruption of the current in the device in parallel with the dut due to the inductance of the harness. the on-board electronic transient interference simulator rv p1p2a meets the latest requirements of iso-7637-2 and gb/t21437.
output pulse voltage us
input impedance ri
rising edge tr
pulse width td
midpulse period t1
number of tests
equipment power supply
p1 (12v system) /p1 (24v system) /p2a
2 q ,4q 10 q ,30 q ,50 q
0.5~1us(10 q)/1.5~3us( 50q2)/0.5~1us(2q2)
coaxial output, built-in coupling decoupling network output
ac220v ± 10p/60hz
the impact of lightning (indirect lightning) in nature and voltage changes caused by large switch switching in power supply lines on power supply lines and communication lines is particularly large, and the impact on products may be destructive. the lightning surge generator is used to evaluate the performance of the equipment when it is subjected to high-energy disturbance from the power line port and other signal line ports. the product meets the requirements of new standards such as iec61000-4-5 and gb/t17626.5.
the lightning surge generator sur 6ka is used to inspect the anti surge protection devices such as zinc oxide arrester valve piece, varistor, spd, tvs tube, gas discharge tube, etc. for surge impact test. the product produces 8/20us surge pulse waveform, and the technical indicators of the waveform comply with the provisions of national standards and iec standards.
in the circuit, such as from the switching transient process (cutting off inductive loads, bouncing relay contacts, etc.), it will usually interfere with other electrical and electronic equipment in the same circuit. this kind of interference is characterized by high amplitude, short rise time, high repetition rate and low energy. clusters of narrow pulses can charge the junction capacitance of semiconductor devices, which may cause circuit or equipment errors when accumulated to a certain extent. the burst generator determines a common reproducible evaluation basis for evaluating the performance of power supply ports, signal, control and grounding ports of electrical and electronic equipment when disturbed by electrical fast transient bursts. the products meet the requirements of new standards such as iec61000-4-4, en60100-4-4 and gb/t17626.4.