power supplies are widely used in modern electronic products, which need to have certain anti-interference ability, isolation and protection functions. different countries and regions have a series of certification standards for various power supplies entering the market to ensure the quality of power products. itech has a rich product line of power test instruments, including ac and dc sources, ac and dc loads, power analyzers, and its9500 power module automatic test system.
iec 60947-1/gb 10408.1
iec 60947-2/gb 10408.2
iec 60947-3/gb 10408.3
iec 60947-4/gb 10408.4
iec 60947-5/gb 10408.5
iec 60947-6/gb 10408.6
iec 60947-10/gb 10408.10
《industrial, scientific and medical (ism) radio frequency equipment - limits and methods of measurement of electromagnetic disturbance characteristics》
《low voltage switchgear and controlgear part 1: general》
《low voltage switchgear and controlgear part 2: circuit breakers》
《low voltage switchgear and controlgear - part 3: switches, isolators, disconnectors, and fuse assemblies》
《low voltage switchgear and controlgear part 4-1: contactors and motor starters electromechanical contactors and motor starters (including motor protectors)》
《low voltage switchgear and controlgear part 5-1: control circuit appliances and switching elements electromechanical control circuit appliances》
《low voltage switchgear and controlgear part 4-2: contactors and motor starters ac semiconductor motor controllers and starters (including soft starters)》
《low voltage switchgear and controlgear - part 5-2: control circuit appliances and switching elements - proximity switches》
▪ electrostatic discharge immunity, contact discharge 4kv, air discharge 8kv
▪ rf electric field radiation immunity, maximum test field strength 10v/m
▪ electrical fast transient burst immunity, maximum test level 4kv
▪ surge (impact) immunity, maximum test level 4kv
▪ rf conducted disturbance immunity, maximum test level 10v
▪ power frequency magnetic field immunity, test field strength 30a/m
▪ voltage sag, short-time interruption and voltage variation immunity, according to iec61000-4-11
▪ the low-frequency immunity of harmonic, inter harmonic and grid signals at the ac power port shall be in accordance with iec61000-4-13
▪ conducted disturbance voltage, 150khz-30mhz, qp/av
▪ radiation disturbance, 30mhz-1ghz, qp
▪ harmonic current emission test according to iec 61000-3-2
▪ voltage fluctuation and flicker test according to iec 61000-3-3
shanghai suoshen electronics is widely used in many industries, such as medical treatment, automotive electronics, home appliances, lighting, electrical appliances, power supply, power facilities and so on
voltage dips/sags, short interruptions are caused by failures of the power grid and power facilities or sudden large changes in loads. in some cases, there will be two or more consecutive dips or interruptions. voltage changes are caused by continuous changes in the loads connected to the grid. if the eut cannot respond in time to changes in the power supply voltage, it may cause malfunctions. voltage dips generators are used to evaluate the performance of electrical and electronic equipment when subjected to voltage dips/sags, short interruptions, and voltage changes. products fully meet the requirements of standards iec/en 61000-4-11 and gb/t17626.11.
the impact of lightning (indirect lightning) in nature and voltage changes caused by large switch switching in power supply lines on power supply lines and communication lines is particularly large, and the impact on products may be destructive. the lightning surge generator is used to evaluate the performance of the equipment when it is subjected to high-energy disturbance from the power line port and other signal line ports. the product meets the requirements of new standards such as iec61000-4-5 and gb/t17626.5.
in the circuit, such as from the switching transient process (cutting off inductive loads, bouncing relay contacts, etc.), it will usually interfere with other electrical and electronic equipment in the same circuit. this kind of interference is characterized by high amplitude, short rise time, high repetition rate and low energy. clusters of narrow pulses can charge the junction capacitance of semiconductor devices, which may cause circuit or equipment errors when accumulated to a certain extent. the burst generator determines a common reproducible evaluation basis for evaluating the performance of power supply ports, signal, control and grounding ports of electrical and electronic equipment when disturbed by electrical fast transient bursts. the products meet the requirements of new standards such as iec61000-4-4, en60100-4-4 and gb/t17626.4.